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Atomic Force Microscopy in Adhesion Studies
Edited by Jaroslaw Drelich and Kash L. Mittal

Books
Out of stock
Publication year: 2005

ISBN-13 (i)The ISBN (International Standard Book Number) has been changed from 10 to 13 digits on 1 January 2007:978 90 67 64434 1
ISBN-10:90 67 64434 X
 
Cover:Hardback
Number of pages:x, 600 pp.
 
List price:€ 204.00 / US$ 302.00

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Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, and development of new technologies for processing and modification of materials. This volume is a comprehensive review of AFM techniques and their application in adhesion studies. It is intended for both researchers and students in engineering disciplines, physics and biology. Over 100 authors contributed to this book, summarizing current status of research on measurements of colloidal particle-solid adhesion and molecular forces, solid surface imaging and mapping, and discussing the contact mechanics models applicable to particle-substrate and particle-particle systems.

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